9570金沙登录入口(中国)有限公司·百度百科

Name :Haibin Pan

Academic rank: Associate professor

Contact Information:Department of Instrument Science and Engineering, School of Mechanical Engineering, Jiangsu University.

Mobile Phone:(86)013775367137

E-mail:panhb@ujs.edu.cn, pan_hb@163.com

Education

2001-2004 Master's degree in Mechanical Engineering, Jiangsu University, China

1997-2001 Bachelor's degree in Mechatronic Engineering, Jinan University, China

Professional Experience

2014- Associate professor, Jiangsu University, China

2006-2014 Lecturer, Jiangsu University, China

2004-2006 Teaching Assistant, Jiangsu University, China

Teaching Courses

Control Engineering Fundamentals

Principle and Application of Microcomputer

Virtual Instrument Technology and Applications

MATLAB Programming and Applications

Skills

ANSI C, National Instruments LabVIEW, National Instruments LabWindows/CVI, MATLAB, Python

Research Interests

Modeling, simulation, control of dynamical systems

Measurement and control technology and modern Instruments design

Embedded system development

Thin film devices and flexible electronics

Part of Scientific Publications

1. Pan H B, Ding J N, Cheng G G. Influence of annealing on microstructure and piezoresistive properties of boron-doped hydrogenated nanocrystalline silicon thin films prepared by PECVD[J]. Journal of Materials Science: Materials in Electronics, 2015, 26(7): 5353-5359.（SCI）

2. Pan H B, Ding J N, Cheng G G, et al. Experimental Investigation of Microstructure and Piezoresistive Properties of Phosphorus-Doped Hydrogenated Nanocrystalline Silicon Thin Films Prepared by PECVD. Micro-Nano Technology, 2014, 609: 208-217.（EI）

3. Pan H B, Ding J N, Cao B G, et al. Design and Evaluation of a High-Accuracy Measurement System for Sheet Resistance of Thin Films. Key Engineering Materials, 2014, 609: 106-112.（EI）

4. Pan H B, Ding J N, Cheng G G, et al. FEM Simulation of a Twin-Island Structure Chip in Piezoresistive Pressure Sensor. Key Engineering Materials, 2011, 464: 208-212.（EI）

5. Pan H B, Yu L H, Cheng G G, et al. Contactless Measurement of the Strain in Microcantilever Based on Position Sensitive Detector. Advanced Materials Research, 2011, 204: 969-972.（EI）

6. Haibin P, Chunsong Y, Xiaofei W, et al. A Novel Measurement System for Hydrogenated Nanocrystalline Silicon Thin Films' Gauge Factor. Electrical and Control Engineering (ICECE), 2010 International Conference on. IEEE, 2010: 201-204.（EI）

7. Haibin P, Jianning D, Boquan L, et al. Design of thin film resistivity measurement system based on virtual instrumentation technology[J]. Journal of Jiangsu University (Natural Science Edition), 2010, 4: 018.（EI）

8. Pan H B, Li B Q, Luo K Y, et al. Design of hydrogenated nanocrystalline silicon film's gauge factor measurement system based on virtual instrumentation technology[J]. Yi Qi Yi Biao Xue Bao/Chinese Journal of Scientific Instrument, 2009, 30:296-299.（EI）